RSNA 2010 

Abstract Archives of the RSNA, 2010


SSE23-03

Impact of Anti-scatter Grids in Overcoming Image Artifacts Caused by Increased X-ray Scatter in Wide Coverage CT Scanners

Scientific Formal (Paper) Presentations

Presented on November 29, 2010
Presented as part of SSE23: Physics (Reconstruction)

Participants

Soji Miyashita, Abstract Co-Author: Nothing to Disclose
Shinichi Tokuyasu RT, Presenter: Employee, Koninklijke Philips Electronics NV, Japan

PURPOSE/AIM

1. Review influence of increasing longitudinal (z-axis) coverage of CT scanners on the x-ray scatter levels. 2. Review Image quality effects of scattered radiation. 3. Review anti-scatter grids and its impact on overcoming x-ray scatter. 4. Demonstrate a simple phantom setup with supporting images to quantify x-ray scatter.  

CONTENT ORGANIZATION

- X-ray scatter fundamentals - Influence of scatter with longitudinal coverage of CT scanners - Impact of scatter on image quality:    o Inaccuracy in reconstructed CT attenuation measurements    o Degradation of contrast-to-noise ratio - Anti-scatter grid fundamentals - Phantom setup to observe effect of scatter - Quantification of scatter - Sample images to demonstrate impact of anti-scatter grids  

SUMMARY

The major teaching points of this exhibit are: 1. Increased x-ray scatter as a function of increasing longitudinal coverage of CT scanners. 2. Scattered radiation causes detected signals to deviate from the true measurement of primary x-ray intensity and may result in artifacts. 3. Experimental setup to observe impact of anti-scatter grids on overcoming degradation of image quality in wide coverage CT scanners.  

Cite This Abstract

Miyashita, S, Tokuyasu, S, Impact of Anti-scatter Grids in Overcoming Image Artifacts Caused by Increased X-ray Scatter in Wide Coverage CT Scanners.  Radiological Society of North America 2010 Scientific Assembly and Annual Meeting, November 28 - December 3, 2010 ,Chicago IL. http://archive.rsna.org/2010/9007498.html